• Based on Leeb Rebound Method
• Metal hardness can be displayed in different hardness scales:HL (Leeb), HRC (Rockwell C), HB(Brinell), HV (Vickers) andso forth.

• Ultra-portable, intelligent Leeb D/UCI probe,
  coupled to IoT and storage data backup ecosystem with a clean user-interface. Software enables you to share and access the data from anywhere.

• Portable ultrasound flaw detector for different types of material and components. Delivering fully traceable inspection data and rapid report creation.

• Standards: ASTM A 956, ASTM E 140, ASTM A 370, ISO 16859, DIN 50156
• Measuring Range – 150-950 HLD
• Conversions 80-955 HV, 81-678 HB, 20-70 HRC, 38-102 HRB, 30-100 HS(Equotip Piccolo 2 only: 274-2193 N/mm2)
• Measuring accuracy ± 4 HLD / HLDL (0.5% at 800 HLD / HLDL)

• Native Scale HLD
• Available Scales HB, HV, HRB, HRC, HS, MPA
• Display – Any compatible iOS device (iPod Touch, iPhone iOS 9.0 and higher)
• Memory – Memory of the iOS device
• Measuring Range 150 – 950 HL
• Measuring Accuracy ± 4 HL (0.5% at 800 HL)

Processing Unit / Sensor

• Configuration: 1 UT channel
• Bandwidth: 0.2 – 20MHz
• Display – Any compatible Apple® iPad (iOS 11 andhigher)
• Supported Scans: A-Scan, Grid
• Measurements: Path length, depth, surface distance, DAC,AWS
  Software / Workspace App
• Automated calibration: Velocity, zero offset
• Test modes: Pulse echo, dual, through transmission or grid

Applications: Heat treatment, Automotive, Cold Rolling etc

 

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